"In an era where rapid development cycles and ever-changing device architectures define the market, smaller Hardware-in-the-Loop (HIL) test benches are transforming how engineers validate performance. Compact test benches not only reduce space requirements and costs but also integrate seamlessly into modern automated testing environments. Trends show a growing shift toward modular, scalable, and agile testing solutions that enable faster deployment and reconfiguration. This approach is critical for supporting real-time applications and dynamic test scenarios, all while ensuring uncompromised quality and reliability."
Modern electronic devices demand faster testing cycles and adaptive test setups. Compact HIL benches allow engineers to run functional tests on powerful, desktop-sized platforms without sacrificing performance.
This agility means teams can rapidly reconfigure test parameters on the fly, which is essential when dealing with unknown test object parameters or changeable configurations.
Smaller HIL systems, such as the xMove Mini-HIL, are designed with open APIs and flexible I/O configurations. This trend is driven by the need for seamless integration into existing test frameworks, reducing the barriers between automated and manual test processes.
With pre-defined scripts and re-configurable pins, these systems allow for fault insertion on all channels—enabling both analog and digital testing in one compact unit.
The move toward smaller, modular test benches also supports cost efficiency. By leveraging compact yet powerful hardware, companies can lower capital expenditure while scaling up their test capabilities as needed.
This modularity is a key trend in today’s test solution market, enabling businesses to invest in future-proof platforms that adapt to evolving requirements.
Functional Specifications
Channels and Signal Types:
Total of 32 flexible channels, each capable of fault insertion, analog/digital I/O, and configurable signal direction.
* Configurable analog inputs (up to 16) and outputs (4, modifiable), along with digital inputs and outputs (16 each).
I
nterconnectivity and Interface:
* 2x 37-pin mass interconnects for power and load, plus 2 DSUB9 connectors for versatile connectivity.
* Supports Ethernet, RS-232, RS-485, USB Host, and CAN communications, ensuring comprehensive integration with existing systems.
Hardware and Performance
Processor and FPGA
* Controller based on Xilinx Artix-7 XC7A200T with quad-core processing at 1.91 GHz.
* Reconfigurable FPGA delivering advanced performance with 269,200 flip-flops and 13,140 kbits of block RAM.
Power and Signal
Integrity:
* Operating voltage range of ±60 V per channel with a maximum current of 16 A, designed to ensure robust and reliable testing under various conditions.
* Built-in fault insertion capabilities across all channels, supporting open circuit, short to +Batt, short to –Batt, and shorts between signals.
Software Support:
* Fully compatible with NI Linux Real-Time (64-bit), with additional support for LabVIEW, TestStand, and NI VeriStand, enhancing versatility and user control.
Measurement System
Digital Measurement:
* 16 differential digital inputs and outputs with a sample clock frequency up to 10 MHz, ensuring precise timing and accurate signal analysis.
Analog Measurement:
* Simultaneous analog inputs available in configurations of 16 single-ended or 8 differential channels, with a 16-bit ADC resolution and a sample rate of 233 kS/s per channel.
* Analog outputs provided with 16-bit DAC resolution and a range of ±10 V, supporting high-precision testing.